Abstract
The crystalline and magnetic properties of Cr-CoNi(Cr)-C layer stacks intended for longitudinal magnetic recording have been investigated. The layers were deposited on rigid disks and silicon wafers by d.c.-magnetron sputtering in inline systems. The details of the system and the process technology determine the morphology of the polycrystalline films. At low angle of incidence of the sputtered atoms textured films will result, giving rise to magnetic anisotropies and signal amplitude modulation of the disks. This modulation problem can be overcome by optimizing the sputtering conditions. The coercivity and remanence of the disks are determined by selection of alloy and thickness. Disks with more than 1300 Oe coercivity can easily be produced.
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