Application of low-voltage Scanning Electron Microscopy to studies of polymer near-surface diffusion and hydrophobicity

Abstract

The study of the surface characteristics of a polymeric insulator - such as silicone rubber (SR) and ethylene propylene diene monomer (EPDM) -- is necessary to understand the hydrophobicity recovery mechanism that governs the ability of insulators to withstand electrical stresses during high voltage service. It has been shown that hydrophobicity of a polymeric insulator surface could be reduced by electrical discharges during outdoor service, causing the surface to become wettable, and thus allow water films to form, and ultimately leading to power outages. It was also reported that the recovery process could be due to the diffusion of low molecular weight (LMW) polymer chains from the bulk of the material to the surface. Because the LMW chains are in fluidic form (oil), they are able to diffuse through the material due to the concentration gradient of these species between the bulk and the surface. The exact mechanism of hydrophobicity recovery in polymeric insulators is still not well understood. In this study, an investigation was conducted to examine the effects of near surface molecular diffusion in the hydrophobicity recovery process of SR and EPDM insulators. Different analytical techniques were used to examine the surface morphology and surface charging effects of these elastomeric materials. Low voltage scanning electron microscopy (LVSEM) was used to measure the second cross-over point (E2) of the material surfaces, and electron spectroscopy for chemical analysis (ESCA) was also used to identify the surface chemical composition.