Abstract
Corrosion and pollution failure of electronic components is a common failure mechanism. How to identify the pollution source, find and locate the corrosion source is the key to the failure case analysis. In this work, the inspection and analysis methods of ion chromatography (IC) detection in plate surface residues, process auxiliary materials, product packaging materials and environmental foreign bodies were studied. Through several different types of electronic product failure analysis cases, the results were compared and verified with the traditional morphology observation, insulation impedance test, EDS composition analysis and infrared spectrum analysis. The application scenario, sampling method and result analysis method of ion chromatography in the corrosion failure analysis of electronic components are defined, which provides guidance and reference for the engineering application of ion chromatography in the corrosion failure prevention of electronic components and devices.
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