Abstract
Journal Article Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis Get access Ralf Terborg, Ralf Terborg RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Martin Rohde Martin Rohde RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 9, Issue S02, 1 August 2003, Pages 120–121, https://doi.org/10.1017/S1431927603440087 Published: 06 August 2003
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