Abstract

Alpha backscattering measurements have been used successfully at the Debrecen nuclear microprobe facility for material analysis. Some of the examples are presented here in detail. Contrary to the traditional RBS technique the scanning RBS microprobe with the detector at grazing exit angle is capable of studying surface topography. This effect is demonstrated by RBS mapping images taken with 2.0 and 2.5 MeV 4He + beams on test samples of different surface patterns containing only one element, Si. The observed effects are discussed.

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