Abstract
We report upon the design of a new gas microstrip detector (GMSD) for use in X-ray absorption spectroscopy applied to the study of catalysis and material science. We show that GMSDs can operate not only with the gas mixtures normally used in proportional counters but also with the majority of gas mixtures used in common catalytic reactions. The detector functions well in the presence of water vapor. EXAFS investigations of a test system of NiO on Ni metal are discussed in which it is demonstrated that depth profiling using electron yield X-ray absorption spectroscopy is possible in a wide variety of gaseous environments. Electron detection of XAS using GMSDs is applicable to metals, semiconductors, and insulators presented in almost all forms of sample including films, pellets, powders, crystals, and liquids.
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