Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials.

Lixin Gu,Xu Tang,Nian Wang,H G Changela

doi:10.1155/2020/8406917

Abstract

Advanced microanalytical techniques such as high-resolution transmission electron microscopy (HRTEM), atom probe tomography (APT), and synchrotron-based scanning transmission X-ray microscopy (STXM) enable one to characterize the structure and chemical and isotopic compositions of natural materials down towards the atomic scale. Dual focused ion beam-scanning electron microscopy (FIB-SEM) is a powerful tool for site-specific sample preparation and subsequent analysis by TEM, APT, and STXM to the highest energy and spatial resolutions. FIB-SEM also works as a stand-alone technique for three-dimensional (3D) tomography. In this review, we will outline the principles and challenges when using FIB-SEM for the advanced characterization of natural materials in the Earth and Planetary Sciences. More specifically, we aim to highlight the state-of-the-art applications of FIB-SEM using examples including (a) traditional FIB ultrathin sample preparation of small particles in the study of space weathering of lunar soil grains, (b) migration of Pb isotopes in zircons by FIB-based APT, (c) coordinated synchrotron-based STXM characterization of extraterrestrial organic material in carbonaceous chondrite, and finally (d) FIB-based 3D tomography of oil shale pores by slice and view methods. Dual beam FIB-SEM is a powerful analytical platform, the scope of which, for technological development and adaptation, is vast and exciting in the field of Earth and Planetary Sciences. For example, dual beam FIB-SEM will be a vital technique for the characterization of fine-grained asteroid and lunar samples returned to the Earth in the near future.

Highlights

Most physical, chemical, and biological processes on Earth involve the interaction of naturally occurring materials at the macroscopic, submicron to nanoscopic scale
Beyond the Earth, unique astrophysical processes are recorded in planetary materials by, for instance, high pressure impact-related minerals [1] and high temperature condensates from the early solar nebula to super nova remnants [2]
This review addresses the advanced use of focused ion beam-scanning electron microscopy (FIB-scanning electron microscopy (SEM)) for a range of application in the natural sciences: from transmission electron microscopy (TEM) analysis of small lunar soil grains, atom-probe tomography (APT) analysis of Pb isotopes in Earth-based zircons, and 3D slice and view of Earth-based shale kerogen to the characterization of extraterrestrial organics by coordinated synchrotronbased scanning transmission X-ray microscopy (STXM)-TEM

Summary

Introduction

Chemical, and biological processes on Earth involve the interaction of naturally occurring materials at the macroscopic, submicron to nanoscopic scale. Beyond the Earth, unique astrophysical processes are recorded in planetary materials by, for instance, high pressure impact-related minerals [1] and high temperature condensates from the early solar nebula to super nova remnants [2] Minerals, in their naturally occurring settings, record their evolutionary histories. The preparation of TEM foils by FIB started in the late 1980s and early 1990s This dual-beam concept benefits from site-specific selection and controlled microscopic sample manipulation. FIB-SEM has become a diverse multifunctional tool for revealing structural, elemental, and isotopic chemical information in natural materials down to the nanometer scale For their effective characterization, analytical methods require adaptation when using the dual beam FIB-SEM system. We assess the future development of the dual beam FIB-SEM technique

A Brief Overview of the Dual Beam FIBSEM System

Applications of the FIB-SEM System

Findings

Conclusion