Abstract
AbstractA CAMECA IMS4f ion microscope was modified to accommodate a fast atom bombardment (FAB) source and used for the analysis of the thin section of a rock sample (granodiorite). In contrast to conventional SIMS using a primary ion beam, it is easy to obtain secondary ion images and mass spectra of poorly conducting material, such as geological samples, by SIMS using a FAB source where the charging effect is easily avoided with the aid of a copper grid placed on the sample surface. The difference of elemental distribution between biotite and feldspar phases in the granodiorite sample was revealed in the positive secondary ion images and mass spectra obtained by use of an O2 FAB source. The images of 23Na+ and 39K+ ions clearly showed that the separation of potassium and sodium feldspars occurred in the process of feldspar crystallization.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
