Abstract
The advent of fast atom bombardment (FAB) and related techniques of secondary ion mass spectrometry has brought new possibilities to the analysis of a variety of polar and involatile compounds not previously amenable to direct mass spectrometric analysis. While molecular weight information is often readily available, conventional FAB mass spectra are frequently devoid of structurally-diagnostic fragment ions. Information may also be obscured by ions arising from the matrix and/or additives used to enhance [M+H]. The use of tandem mass spectrometry (MS/MS) may assist in these respects by producing fragment ion spectra derived from selected parents via monitoring of unimolecular decompositions or collision-activated dissociation (CAD) occurring in a field-free region.
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