Abstract
The usefulness and validity of energy dispersive grazing incidence X-ray reflectometry (ED-GIXR) have been demonstrated for characterizing the liquid/liquid and liquid/solid interfaces. The present method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper half liquid layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. An apparatus newly built for the exclusive use of the ED-GIXR is described with some selected examples of X-ray reflectivity profiles of solution/mercury and solution/electrode interfaces.
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