Abstract
This paper concerns the implementation of shape-designed complementary signals (CSs), which were matched to the frequency characteristic of the circuit under test, in built-in self testers (BISTs), dedicated to mixed-signal embedded electronic systems for testing their analog sections. The essence of the proposed method and solution of CS BIST is low-cost realization on the base of hardware and software resources of microcontrollers that were used in contemporary embedded systems. This paper presents a description and a theoretical basis of known bipolar CSs and unipolar CSs proposed by the authors, results of investigations of metrological properties of CSs, and a solution of CS BIST and its experimental verification on the examples of testing second- and fourth-order Butterworth filters.
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