Abstract

Nitrogen deficiency influences importantly the plant photosynthetic capacity and crop productivity. Here, we employed the rapid, non-invasive measurements of chlorophyll a fluorescence kinetics for calculation of the integrative fluorescence parameters related to the leaf photosynthetic performance. In pot experiments with winter wheat (Triticum aestivum L.) we cultivated plants during the whole growing period in the soil substrate supplied with four different doses of nitrogen. The leaf nitrogen and chlorophyll content as well as the plant dry mass were analyzed after chlorophyll fluorescence records in three growth stages. Our results indicate that the commonly used parameter F<sub>v</sub>/F<sub>m</sub> (the maximum quantum yield of photochemistry) was almost insensitive to nitrogen treatment. In contrary, the performance index (PI<sub>abs</sub>) and total performance index (PI<sub>tot</sub>) were much more responsive and significant differences among plants of different nitrogen treatments as well as between the youngest and third leaf from the top were observed. Parameter PI<sub>tot</sub> was shown to express only small diurnal changes, thus being more reliable and more useful for comparison of different samples in field conditions than more frequently used parameter PI<sub>abs</sub>.

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