Application of atomic force spectroscopy (AFS) to studies of adhesion phenomena: a review

Abstract

This review article describes the fundamental principles of atomic force spectroscopy (AFS) and how this technique became a useful tool to investigate adhesion forces. AFS is a technique derived from atomic force microscopy (AFM) and can determine, at every location of the sample surface, the dependence of the interaction on the probe–sample distance. AFS provides valuable information, at the nano-scale, such as, for example: (i) how the magnitude of the adhesion force depends on longand short-range interactions and (ii) the tip–sample contact area. An overview about the theory and experiments with local force spectroscopy, force imaging spectroscopy, chemical force microscopy and colloidal probe technique is presented. The many applications of the AFS technique for probing surface interactions open up new possibilities to evaluate adhesion, an important characteristic of materials.