Application of a Projection Method to a Mode-Matching Solution for Microstrip Lines with Finite Metallization Thickness (Short Paper)

Abstract

It will be demonstrated that the convergence behavior of the well-knowm mode-matching technique can be improved significantly by a general projection method. The advantage of this approach becomes obvious in the discussion of the electromagnetic field distribution near metal edges. The implementation is rather simple and will be described below. Numerical results and the validity of this method are discussed for shielded microstrip lines with finite metallization thickness.