Abstract
Performance characteristics of a microstrip gas counter operated as an x-ray fluorescence spectrometer are reported. Gas amplification as a function of microstrip anode–cathode voltage was measured, and the breakdown threshold voltage was determined in pure xenon. The detector temporal stability and the effect of gas purity were assessed. Energy resolution and linearity, detection efficiency and uniformity of spatial response in the 2–60 keV x-ray energy range were determined from the pulse-height distributions of the fluorescence x-ray spectra induced in a variety of single- and multi-element sample materials. Energy resolution similar to that of conventional proportional counters was achieved at 6 keV. © 1997 John Wiley & Sons, Ltd.
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