Application of a hyperspectral camera for in situ plasma-material interaction studies at the linear plasma device PSI-2.

Abstract

A hyperspectral camera (HSC-type Specim IQ) has been applied at the linear plasma device PSI-2 under steady-state conditions. The camera has the capacity of hyperspectral imaging (HSI) with the dimension of a data array 512 × 512 × 204 (x, y, λ) covering the spectral span from 400 to 1000nm with moderate average spectral resolution (FWHM ∼7nm). After radiometric calibration and background/continuum emission subtraction, two main applications of the camera, (i) plasma diagnostics in helium (He) plasmas and (ii) plasma-material interaction studies with tungsten (W) targets in neon (Ne) plasmas, have been carried out. The measurements were complemented by a movable Langmuir double probe system (LP) measuring electron temperature (Te) and electron density (ne) in radial direction r and a fiber-coupled cross-dispersion spectrometer with high spectral resolution (Spectrelle) recording neutral He, W, and Ne emission lines over the full plasma column. (i) Two-dimensional (2D) imaging of Te and ne radial profiles in axial direction z of the He plasma column were for the first time obtained by the regression analysis of Te and ne (from LP) and six He I line ratios (from HSC). The spatially resolved plasma parameters covered in these studies range between Te ∼ 0.8-13.4eV and ne ∼ 0.2 × 1018-3.9 × 1018m-3 and permit a reconstruction of the plasma conditions in PSI-2 in 2D without LP perturbation. (ii) W sputtering was studied in situ in Ne plasmas exposing W target samples (negatively biased at 100V) under perpendicular Ne plasma impact. Simultaneously, the 2D distributions of W (W I line at 429.5nm) in front of the target and the 2D Ne plasma distribution (Ne I line at 703.2nm) were recorded with complete spectral separation as confirmed by the Spectrelle spectrometer. This permits the simultaneous measurement of the neutral W penetration and its angular distribution induced in the sputtering process and of the impinging plasma distribution. The HSI technique offers, despite a few technical drawbacks, such as the moderate spectral resolution and poor time resolution, a new possibility to distinguish multiple emission lines from plasma and impurities and complements the portfolio of existing Optical Emission Spectroscopy techniques, providing a good compromise regarding spectral, spatial, and temporal resolution.