Abstract
The result of a digital transmission test of a YBa/sub 2/Cu/sub 3/Ox/MgO/Au microstrip line to coplanar waveguide transmission line converter is reported. It was fabricated in order to introduce a microwave design technology for high-speed digital testing. The performance was verified using a cryogenic vector network measuring technique. The transmission characteristics of the microstrip line to coplanar waveguide transmission line converter was almost the same as YBa/sub 2/Cu/sub 3/Ox/MgO/Au microstrip line at frequencies from 40 MHz to 10 GHz at 30 K. The bit error rate was analyzed using a 2/sup 23/-1 pseudo random binary signal at 3 GHz. The degradation of the bit error rate caused by the microstrip line to coplanar waveguide transmission line converter and the measuring system itself are discussed using the Q factor of the signal obtained from the bit error rate analysis and the transmission characteristics obtained by the vector network measurement.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.