Abstract
AbstractA buffered dielectric measurement method is described. We added a thin buffer polymer layer to a polymer film before depositing aluminum electrodes. This is a modification to conventional parallel plate dielectric constant measurement method. It still has well-defined geometric factor for determining the dielectric constant. We designed the buffer layer using a simple RC model. It was determined that the buffer layer should be a high dielectric constant polymer. Two high dielectric constant polymers were selected to be buffer layers. Layered samples with structures ABA and ABC were discussed, where A is the buffer layer. We show that the method not only provides a way to preserve the structure of special polymer films, but also is able to adjust its electrical characterization to a convenient level.
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