Abstract
We present the latest results of our continuing research on atom probe field ion microscopy on aluminum alloys. The motivation behind the research is to understand the effect of trace elements and nanoscale compositional fluctuations on the development of microstructures in aluminum alloys produced by different manufacturing processes. The nanoscale compositional analyses of Al-Cu-Mg-Ag, Al-Li and AlCeNiFe nanocrystalline alloys are presented.
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