Abstract

Both fluorescence imaging and atomic force microscopy (AFM) are highly versatile and extensively used in applications ranging from nanotechnology to life sciences. In fluorescence microscopy luminescent dyes serve as position markers. Moreover, they can be used as active reporters of their local vicinity. The dipolar coupling of the tip with the incident light and the fluorophore give rise to a local field and fluorescence enhancement. AFM topographic imaging allows for resolutions down to the atomic scale. It can be operated in vacuum, under ambient conditions and in liquids. This makes it ideal for the investigation of a wide range of different samples. Furthermore an illuminated AFM cantilever tip apex exposes strongly confined non-propagating electromagnetic fields that can serve as a coupling agent for single dye molecules. Thus, combining both techniques by means of apertureless scanning near-field optical microscopy (aSNOM) enables concurrent high resolution topography and fluorescence imaging. Commonly, among the various (apertureless) SNOM approaches metallic or metallized probes are used. Here, we report on our custom-built aSNOM setup, which uses commercially available monolithic silicon AFM cantilevers. The field enhancement confined to the tip apex facilitates an optical resolution down to 20 nm. Furthermore, the use of standard mass-produced AFM cantilevers spares elaborate probe production or modification processes. We investigated tobacco mosaic viruses and the intermediate filament protein desmin. Both are mixed complexes of building blocks, which are fluorescently labeled to a low degree. The simultaneous recording of topography and fluorescence data allows for the exact localization of distinct building blocks within the superordinate structures.

Highlights

  • Scanning near-field optical microscopy (SNOM) provides subwavelength optical resolution [1]

  • We used a home-built apertureless scanning near-field optical microscopy (aSNOM) setup that consists of an atomic force microscopy (AFM) head mounted on a discretely designed inverted optical microscope (Figure 2a)

  • For detection of the fluorescence emission we used a confocal scheme with a gated avalanche photodiode (APD) (SPCMAQR-13, Perkin Elmer, Waltham, MA, USA)

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Summary

Introduction

Scanning near-field optical microscopy (SNOM) provides subwavelength optical resolution [1]. Both are mixed complexes of building blocks, which are fluorescently labeled to a low degree. The simultaneous recording of topography and fluorescence data allows for the exact localization of distinct building blocks within the superordinate structures. The sample is excited by the strongly confined near-field at the tip apex, which is induced by the dipolar coupling between the incident light and the probe.

Results
Conclusion

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