Abstract

There has been proposed the method of diffusion investigation by layer analysis based on the measurement of X-rays formed in β-X conversion process. This method has two versions i.e. the measurement of K X-rays characteristic for a given element and the measurement of high-energy part of bremsstrahlung radiation spectrum. The second version has been tested on the base of bismuth diffusion in copper. This method can be applied to all β-emitting radionuclides which diffuse in medium of sufficiently high atomic number.

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