Antiferromagnetic domain modulation of NiO(1 0 0) induced by thickness-dependent interfacial coupling with Cr overlayer

Abstract

The nature of interfacial antiferromagnetic domains of NiO(1 0 0) substrate of Cr overlayer system was investigated by X-ray photoemission electron microscopy (XPEEM). Combining the XPEEM with X-ray linear magnetic dichroism, we found that antiferromagnetic domain contrast of NiO varies periodically as a function of Cr thickness. The contrast is clearer at the region covered by even layers Cr film than that at odd layers. The periodic contrast modulation is attributed to the different magnetic coupling between odd/even layer Cr film and NiO substrate.