Abstract
AbstractA method for computing the far‐field pattern of an antenna under test (AUT) from near‐field data is presented. Based on the equivalence principle, the AUT is replaced by equivalent magnetic surface currents, whose components are optimized using microgenetic algorithms. Results of reconstructed far‐field patterns from synthetic near‐field samples, a comparison to the approach using classical methods, and an analysis of the method's performance and limitations are included. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 21–25, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20195
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