Abstract
Abstract The anomalous X-ray scattering (AXS) technique was applied to a structural study of GeO2 glass, using synchrotron radiation and a new goniometer system. The environmental radial distribution function (RDF) was determined from intensity measurements at the Ge K absorption edge and compared with the ordinary RDF curve estimated from the. X-ray scattering intensity by Mo K α radiation. By combining the environmental and ordinary RDFs of the GeO2 glass it has been confirmed that the fundamental local unit structure is a GeO4 tetrahedron and that these tetrahedra are joined at their corners to form a network structure. The capability of the AXS technique has been approved as a relatively new tool for the structural characterization of disordered materials.
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