Abstract
In order to explore local- and intermediate-range atomic structures of several semiconducting and metallic glasses, anomalous X-ray scattering (AXS) experiments were performed using an improved detecting system suitable for third-generation synchrotron radiation facilities, and the obtained data were analyzed using reverse Monte Carlo (RMC) modelling to obtain partial structure factors and to construct three-dimensional atomic configurations of these glasses. Examples of GeSe2 semiconducting and Pd40Ni40P20 metallic glasses are demonstrated to exhibit the feasibility of the combination of AXS and RMC techniques. Importance of an additional combination with neutron scattering is also described for alloys containing light elements.
Highlights
Anomalous X-ray scattering (AXS) is a noble method [1,2,3] that can provide structural information on both the short- and intermediate-range order (SRO and IRO) around each constituent element in non-crystalline materials
We demonstrate our recently developed AXS technique and the feasibility of the combination with reverse Monte Carlo (RMC) modelling for the typical chalcogenide glass GeSe2 [16, 17] and the bulk metallic glass Pd40Ni40P20 [18, 19] as examples
We have demonstrated the feasibility of the AXS technique with high statistical quality in combination with RMC modelling
Summary
Anomalous X-ray scattering (AXS) is a noble method [1,2,3] that can provide structural information on both the short- and intermediate-range order (SRO and IRO) around each constituent element in non-crystalline materials. Recent developments in third-generation synchrotron radiation sources led to a tremendous increase of incoming flux, this did not help to solve the problems of the above mentioned parasitic scattering contributions. This is related to the X-ray detecting system. Pure Ge solid-state-detectors (SSD) are commonly used for AXS experiments This type of detector is very sensitive and can collect energy-resolved data of scattered X-rays. We have developed a detecting system effective for intense third-generation synchrotron radiation It consists of a graphite analyzer crystal in combination with a long detector arm [8, 9], which gives well-resolved elastic scattering signals with high statistical quality. Importance of an additional combination with neutron scattering is described for the Pd40Ni40P20 alloy
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