Abstract
In tests of typical iron-based materials, it has been found that the dissolution efficiency at low temperature is greater than that at ambient temperature. By utilizing sputtering X-ray photoelectron spectroscopy (sputtering XPS) and focused ion beam scanning electron microscopy (FIB-SEM), it was found that this abnormal phenomenon is rooted in a thinner passive film and lower valence oxides formed on the surface at low temperature. Transmission electron microscopy (TEM) analysis supported these conclusions at the microscopic level. First-principles calculations further revealed that lower valence oxides of iron are more conductive than higher valence oxides.
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