Anomalous density, sound velocity, and structure of pressure-induced amorphous quartz

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The study of quartz and other silica systems under pressure is one of the most prolific domains of research over the past 50 years because of their applications in material science and fundamental relevance to planetary interiors. The characterization of the amorphous state is essential for the comprehension of pressure-induced amorphization of minerals, the metamorphism observed in shocked materials, and the study of melt structures under pressure. Here, we measured in situ, under static compression the density, sound velocities, and electronic structure of quartz as it passes through its pressure-induced amorphization transition. The transition pressure could be derived from the abrupt increase in density and sound velocity at 24 GPa, and from strong changes in the silicon ${L}_{2,3}$ edge and oxygen $K$ edge between 22 and 27 GPa observed in x-ray Raman scattering data, confirming previous results from x-ray diffraction. Above this pressure, our data show an anomalous behavior in density, sound velocity, and electronic fine structure compared to the cold compressed glass and other silica polymorphs. The pressure-induced amorphous quartz has a lower density relative to that of the compressed glass, consistent with the lower average coordination inferred from a different signature in the Si ${L}_{2,3}$ and O $K$ electronic absorption edges measured by x-ray Raman scattering spectroscopy. This behavior sheds light on the pressure limit of tetrahedral units in ${\mathrm{SiO}}_{2}$ components and the existence of polyamorphism in network-forming materials, and highlights the possibility to discriminate between different amorphous states with x-ray Raman scattering spectroscopy.