Abstract
We report an abnormal current–voltage ( I–V ) characteristic observed on an Au–Si interface fabricated by a unique focused ion beam sputtering microdeposition method. The Au–Si interface shows neither Schottky nor ohmic behavior, but the I–V curve has a d I /d V peak at zero voltage. High-resolution transmission electron microscopy studies reveal the existence and unstable nature of an ∼10 nm thick interfacial layer at the Au–Si contact. The unusual electrical behavior is likely correlated with this metastable interfacial layer.
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