Abstract
In order to study the “fractional Hall effect model” of the carrier state of high temperature superconductors, we measured the x dependence of the capacitance C t of multilayer structure Pd/La 2− x Sr x CuO 4/(100)SrTiO 3/Pd. A strong correspondence is found between the x- C t relationship and the filling factor ν dependence of the system energy in the fractional quantum Hall effect.
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