Abstract
The surface composition of the anodic oxidation film on Hg0.8Cd0.2Te (MCT) has been studied by means of angle and X-ray power-dependent X-ray photoelectron spectroscopy (XPS) techniques. The anodic oxidation film is composed of oxides and hydroxides, in which a tellurium oxide with a low valence is involved. The hydroxides are more predominant in the outermost layer. The low valence oxide (Te2+) is changed to a high valence oxide (Te4+) with X-ray power higher than 40 W. Furthermore, such high-power irradiation induces evaporation of mercury oxides and/or hydroxides and conversion of hydroxides to oxides. These changes are observed also in the spectrum obtained under monochromatized X-ray irradiation.
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