Abstract
Data on optical reflectance and anodization voltage, obtained during the galvanostatic anodization of metallic niobium foils in an H 3PO 4 (1%) solution at room temperature were simultaneously recorded as a function of time, to determine the thickness of the Nb 2O 5 films formed. From these data, plots of film thickness vs anodization voltage were obtained. A linear relation was always observed and in all cases but one, an angular coefficient of 22 Å V −1 was verified.
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