Annular-type solid state detector for a scanning x-ray analytical microscope

Abstract

An annular-type solid state detector (SSD) was attached to a scanning x-ray analytical microscope to accomplish certain superior analytical features. The major advantages of this kind of attachment are a large solid angle for detection of scattered x rays from a small point covering the entire Debye–Sherrer ring diffracted from a polycrystalline sample. To demonstrate the above features, the crystallite distribution of an agate sample was depicted as a micrograph using the diffraction intensities of 101̄1 reflection of quartz. For comparison and to emphasize the special features of the present setup, a similar observation was also carried out by a conventional SSD.