Abstract
In the present work, we demonstrate the growth of tin oxide (SnOx) thin films using electron beam evaporation method to study the phase transition from stannous oxide (SnO) to stannic oxide (SnO2) by varying annealing temperature (i.e., from 300 to 700 °C). Annealing induced morphology evolution and structural modifications stimulate the process of phase-transformation, which is primarily discussed by divided the entire temperature range into two-regimes. Regime-A (from 300 to 400 °C) consists of tetragonal α-SnO dominated phase, regime-B (from 600 to 700 °C) exhibits orthorhombic pure SnO2 phase. However, these regimes are being separated by an interface conferring a mixed-phase of tin oxides at an annealing temperature ∼500 °C. This temperature-dependent phase-inversion is adequately controlled by tuning the morphological, structural and optical properties of SnOx thin films to develop homo/heterostructures for various photovoltaic and optoelectronic applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
More From: Inorganic Chemistry Communications
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
