Annealing Conditions of SCO Buffer Layer via Slot-Die Technique

Abstract

A biaxially textured Sm0.2Ce0.8O1.9-x (SCO) single buffer layer has been prepared on textured Ni-5%W alloy substrate using slot-die coating for REBCO ( $\text{RE}=\text{Y}$ , La, and other lanthanides)-coated conductors. A smooth, uniform, and crack-free SCO buffer layer with sharp (200) $c$ -axis orientation has been obtained by controlling the annealing conditions, including the decomposition rate of SCO precursor film, the flow rate of protective gas, the heat treatment temperature, and time.