Abstract

The EPR spectrum of the neutral substitutional phosphorus donor has been observed in originally undoped float-zone silicon after irradiation with thermal neutrons. The EPR intensity has been measured as a function of annealing temperature between 250 and 1100 °C. The minimum temperature required to achieve full phosphorus activity is near 700 °C if the material is irradiated in a purely thermal neutron beam. If the thermal and fast-neutron doses are comparable, this limit is near 800 °C. Observed annealing stages at 350, 600, and 700 °C correlate with published recovery data for specific defects.

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