Abstract
By X-ray diffraction line profile analysis it is possible to obtain valid information of structure and properties of materials. This method is a powerful tool for nanomaterials microstructure characterization. In the present work mechanical alloying of ternary system Cu -2 wt. % Cr -6 wt. % Mo was made between 0.25 and 4 h of milling. By means of modified Warren-Averbach and Williamson-Hall methods the crystallite size, dislocation density, microstrain and average distance between dislocations were estimated. The crystallite size values were corrected by stacking fault presence. It was demonstrated that powders have a high anisotropic strain, which was corrected using the average dislocation contrast factors for fcc structures. Also the influence of milling time and percentage of solute on stacking fault probability and stacking fault energy was determined.
Highlights
By X-ray diffraction line profile analysis it is possible to obtain valid information of structure and properties of materials
This method is a powerful tool for nanomaterials microstructure characterization
The crystallite size values were corrected by stacking fault presence
Summary
Los sistemas binarios cobre-cromo y cobre-molibdeno presentan inmiscibilidad en estado sólido. Una alta densidad de defectos cristalinos cambia la microestructura y, por tanto, alejan a los materiales del equilibrio y hacen posible obtener nuevas. El ensanchamiento de los perfiles de difracción es causado por varios motivos, tales como disminución del tamaño de cristalito, aumento de la cantidad de dislocaciones, aparición de faltas de apilamiento, acumulación de microdeformación, principalmente[13]. Varios autores[14 y 15] han propuesto que la microdeformación en los materiales se debe a la presencia de dislocaciones, que causan una deformación anisotrópica y cuyo efecto puede ser considerado a través del uso de los factores de contraste [16,17,18,19]. Denominada WQBil2lLi4alnm(Rs1o/nL)-lnH(Ra2l/lLm) (go2ic)2ada, que toma en cuenta los efectos de deformación anisotrópica (Ec. (3))
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