Abstract

Microhardness of single crystals La 3 Ga 5 SiO 14 , La 3 Ta 0.5 Ga 5.5 O 14 , Ca 3 TaGa 3 Si 2 O 14 family of lantanum gallium silicate of trigonal symmetry class of 32 space group P 321 has been researched by Knoop method. Anisotropy of microhardness determined by the ability to bring the material under the indenter, which determines the value of microhardness on different planes and in different crystallographic directions in the plane. The technique of measuring the microhardness by Knupp method for semi − automatic hardness tester Tukon 2100B for single crystals of langasite family. Anisotropy of the I group of microhardness (microhardness polar dependence on indentor position relatively crystallography directions in the plane of measurement) on the crystallography planes (112 − 0), (011 − 0), (0001) has been founded. Anisotropy of microhardness in fragile crystals of langasite family determined by the possibility of mass transfer under the indenter due to the movement of interstitial atoms and vacancies of oxygen and gallium. Measurements have shown that microhardness on all investigated planes of CTGS single crystals, as base, and the prismatic lower than the respective planes of LGS and LGT single crystals; wherein in CTGS single crystals there is no anisotropy of microhardness microhardness as I, and II type. Polar dependence of the mechanical properties of langasite and langatate single crystals should be taken into account in the surface treatment technology and manufacturing techniques of piezo − and acoustoelements.

Highlights

  • Microhardness of single crystals La3Ga5SiO14, La3Ta0.5Ga5.5O14, Ca3TaGa3Si2O14 family of lantanum gallium silicate of trigonal symmetry class of 32 space group P321 has been researched by Knoop method

  • Anisotropy of microhardness determined by the ability to bring the material under the indenter, which determines the value of microhardness on different planes and in different crystallographic directions in the plane

  • Anisotropy of microhardness in fragile crystals of langasite family determined by the possibility of mass transfer under the indenter due to the movement of interstitial atoms and vacancies of oxygen and gallium

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Summary

АНИЗОТРОПИЯ МИКРОТВЕРДОСТИ КРИСТАЛЛОВ СЕМЕЙСТВА ЛАНГАСИТА

Исследована микротвердость по методу Кнуппа монокристаллов La3Ga5SiO14 (ЛГС), La3Ta0,5Ga5,5O14 (ЛГТ), Ca3TaGa3Si2O14 (КТГС) семейства лантан−галлиевого силиката тригонального класса симметрии 32 пространственной группы Р321. Что микротвердость на всех исследованных плоскостях монокристаллов КТГС (как на базисных, так и на призматических) ниже, чем на соответствующих плоскостях монокристаллов ЛГС и ЛГТ. В ЛГС (La3Ga5SiO14) — это Ga3+ и Si4+, в ЛГТ (La3Ta0,5Ga5,5O14) — Ga3+ и Ta5+, что является причиной беспорядочно распределенного искажения структуры и приводит к изменению свойств. Общие физические свойства ЛГС, ЛГТ, КТГС и кварца представлены в табл. 2. Кристаллографические направления в кристалле ЛГС монокристаллах ЛГТ обнаружено существенное изменение микроструктуры, Таблица 2 указывающее на протекание процессов пластической Общие физические свойства лангасита, лангатата и катангасита [1, 3, 7] деформации — возрастание

Коэффициент электромеханической связи
Образцы и методы исследования
Полярная анизотропия микротвердости I рода
Рабочее положение
Анизотропия микротвердости по методу Кнуппа
Библиографический список

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