Abstract
Magnetic anisotropy dispersion in sputter-deposited rare-earth transition-metal amorphous films is measured by the methods of Hall hysteresis loops and torque magnetometry. The inhomogeneity in the orientation of the easy axes of magnetization is found to be rather large; the mean inclination angle of the axes from film normal is 16.5° in a Gd–Tb–Fe film. Results show a clear correspondence between the anisotropy dispersion and Kerr rotation angle, and both depend on the bias voltage applied to the substrates during sputtering. Anisotropy dispersion is an important property for evaluating the amorphous magnetic films for magneto-optical storage application.
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