Abstract
Atomic layer semiconducting black phosphorus (P) exfoliated from its bulk crystals offers excellent properties and promises for emerging two-dimensional (2D) electronics, photonics, and transducers. It also possesses unique strong in-plane anisotropy among many 2D semiconductors, stemming from its corrugated crystal structure. As an important thermophysical aspect, probing the anisotropic thermal conductivity of black P is essential for device engineering, especially for energy dissipation and thermal management. Here, we report on measurement and analysis of anisotropic in-plane thermal conductivity of black P crystal, in a mechanically suspended device platform, by exploiting a novel opto-thermomechanical resonance spectromicroscopy (OTMRS) technique. With spatially resolved heating effects and thermomechanical resonance motions of suspended structures, anisotropic in-plane thermal conductivity (κAC and κZZ) is determined for black P crystals of 10-100 nm thick. This study validates a new noninvasive approach to determining anisotropic thermal conductivity without any requirement of preknowledge of crystal orientation or specific configurations of structure and electrodes according to the anisotropy.
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