Abstract
The engineering of the microstructure of a superconducting FeSe thin film by the choice of a proper substrate and its crystallographic orientation is demonstrated. To this end epitaxial c-axis oriented FeSe thin films are grown on (110) oriented single-crystalline SrTiO3 substrates by means of sputtering. The extraordinary microstructure is characterized by the uniaxial alignment of plate-like crystalline grains along the substrate direction. The alignment of the elongated grains eventuates in a direction-dependent grain-boundary structure associated with an anisotropic grain-boundary density along the two perpendicular and substrate directions. The effect of the grain-boundary structure on the observed anisotropies of the temperature dependent in-plane resistivities and critical current densities in transverse magnetic fields is extensively studied for current transport along and
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