Abstract

Structural and dynamic magnetization properties of Co2MnAl (CMA) full Heusler alloy thin films grown on Si (100) substrate at different substrate temperatures (Ts) 30°C, 200°C, 300°C, 400°C and 500°C are investigated. XRD patterns revealed the formation of B2 partially ordered phase at Ts=200°C and above. Ferromagnetic Resonance (FMR) technique have been used to determine the damping constant (α), resonance field (Hr) and line width (ΔH) of recorded spectra and fitted by using Landau-Lifshitz-Gilbert (LLG) equation. The lowest damping constant was found to be 0.007±0.002 for the film grown at Ts=200°C. Films exhibit uniaxial magnetic anisotropy. Anisotropic damping constant α is calculated along the easy and hard axis. Along the two directions remarkable change (almost ∼59%) in α is observed.

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