Abstract
Specific morphological features of polymer semiconductors are often promoted in devices to optimize optoelectronic behavior. Less studied is the role of morphology on the mechanical properties of the film, such as elastic modulus, which is an important property for the development of flexible and stretchable devices. To gain insight into the morphological origin of elasticity in polymer semiconductors and its relationship to charge transport, we study the anisotropic in-plane elastic modulus of strain-aligned regioregular poly(3-hexylthiophene) (P3HT) films and compare the results to previously measured field effect charge mobility. The film morphology is varied through the amount of applied strain and post strain thermal annealing. Morphological characterization includes UV–vis optical spectroscopy and X-ray diffraction. The elastic modulus is measured using a buckling-based measurement technique. The elastic modulus of the film is found to decrease as the film is plastically strained. Thermally annealin...
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