Abstract
Rotational streaking by a circularly polarized THz field of Auger electrons generated by a short extreme ultraviolet (XUV) or x-ray pulse is theoretically investigated. The character of the streaking pattern depends on three main parameters: the duration of the XUV pulse, the Auger decay time-of-life and the period of the THz field. Different cases with various interrelations of these parameters are discussed. Examples of the patterns are calculated within the strong field approximation. Correspondence between the angular streaking of electrons in the processes of photoionization and Auger ionization is considered. Retrieval of the Auger decay parameters from the circular streaking spectrum is discussed.
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