Abstract
An experimental study was conducted to investigate the angular memory effect of millimeter‐wave scattering from two‐dimensional conducting random rough surfaces. The surfaces under investigation were machine‐fabricated with known Gaussian roughness statistics, and the copolarized and cross‐polarized angular correlation functions (ACFs) of scattering amplitudes were measured. It was found that for the case of reference antenna positions located bistatically in a backward direction, the measured ACF exhibits broad response when single scattering dominates but two peaks when multiple scatteringdominates. These observations are in good agreement with the second‐order Kirchhoff approximation (KA2). Specifically, the observed broad and peak responses are analytically identified to be due to the first‐order and second‐order (ladder and cyclical) scattering components, respectively, in KA2.
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