Abstract
The negative transverse magnetoresistance effect was observed in n-inversion layers in Si-MOS (111) surfaces at temperatures between 1.5 and 8.3 K. The negative magnetoresistance depends only on the normal component of the magnetic field to the surface and has a saturation value at high fields. The difference between the resistivity at zero field and that at saturation field increases logarithmically with decreasing temperature such as the effect due to the s- d scattering (Kondo effect).
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