Abstract
The Raman intensity from thin films on a hemicylinder glass prism (refractive index n=1.88) was measured by the total reflection method as a function of the Raman scattering angle (α) and the polarization of the exciting laser beam. The results were in good agreement with an electromagnetic theory. The Raman intensity is a sharp function of α and the maximum intensity is obtained near the critical angle of α c = sin -1(1/ n) of the prism side. The change in polarization state of the exciting laser beam resulted in remarkable variations of the Raman intensity, and besides, the intensity changed depending upon molecular orientations and symmetry of vibrational modes. These facts indicate that the sensitivity of total reflection Raman spectroscopy can be remarkably improved by exciting surface species with a suitably polarized laser beam and by measuring Raman scattered light through the prism at α c.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
