Abstract
We have carried out an angle-resolved photoemission study for Ag/Cu/Ag/Cu(1 1 1) system in order to investigate the electronic coupling between the two quantum-well (QW) states in the double Ag nanofilm structures. It is found that the outer nanofilm thickness dependence of QW state in double Ag nanofilm structures can be explained as the electronic coupling through the thin Cu barrier layer between the QW states in the inner and outer Ag nanofilms. It is also found that the coupling strength depends on the Cu barrier thickness. From these results, we discuss the electronic coupling between the two QW states in the double Ag nanofilm structures.
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