Abstract
Abstract An imaging-plate system designed for the full Rietveld refinement of crystal structures at high pressure is described. Emphasis is given to techniques that have been developed to obtain data free from contaminating diffraction peaks and to a general method of processing the diffraction data. The advantages of using pressure cells that allow full diffraction patterns to be collected are also described. Presented at the IUCr Workshop on ‘Synchrotron Radiation Instrumentation for High Pressure Crystallography’, Daresbury Laboratory 20-21 July 1991
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