Abstract
AbstractInterference between multipole modes of Mie resonance provides the possibility to tailor a radiation pattern of a subwavelength optical resonator. Unidirectional scattering arising from constructive and destructive interferences between electric and magnetic dipolar modes in a nanoantenna allows to design a variety of metasurfaces. However, experimental determination of radiation patterns of an individual nanoobject and the decomposition into multipoles have not been performed under plane wave illumination due to the inability of angular analysis in a conventional optical microscope. To this end, an angle‐, polarization‐, and wavelength‐resolved microscopy setup is developed in this work to measure radiation patterns of an individual nanoobject. A single spherical silicon nanosphere is employed as an ideal Mie resonator and the angle‐ and polarization‐resolved scattering is measured in the angular range from 30° to 150° against the incident angle. It is shown that Mie scattering from the electric and magnetic dipoles of a single silicon nanosphere is selectively measured in the setup.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
