Year-end Sale % OFF 
Abstract
In this paper, the bitstream of 28 nm field-programmable-gate-array was resolved. The relationship between the frame address and the resource was obtained. The fault injection platform was designed based on the information of the bitstream which obtained by partial reconfiguration. With this fault injection platform, the equivalence of the global fault and random fault injections was verified. Also, the sensitivities of different circuits were tested by random fault injection. The reinforcement effect of the triple module redundancy for sensitive resources in 28 nm FPGA was also be tested.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
